{"id":332,"date":"2016-09-01T11:01:59","date_gmt":"2016-09-01T15:01:59","guid":{"rendered":"https:\/\/web.uri.edu\/nano\/?page_id=332"},"modified":"2023-02-22T09:33:39","modified_gmt":"2023-02-22T14:33:39","slug":"fe-sem","status":"publish","type":"page","link":"https:\/\/web.uri.edu\/nano\/fe-sem\/","title":{"rendered":"FE-SEM"},"content":{"rendered":"<p><strong>Instrument : <\/strong>Zeiss Sigma VP field emission scanning electron microscope (FE-SEM) with Oxford Instruments X-max 50 mm<sup>2<\/sup> energy dispersive X-ray spectroscopy (EDS\/EDX) and Gatan Aalto 2500 cryogenic attachment. InLens detector, secondary electron detector, backscattered electron detector, cathodoluminescence and variable pressure mode for non-conductive materials. Detector design allows analysis of magnetic materials at high resolutions. Maximum resolution 2 nm. <span id=\"dnn_ctr469_dnnTITLE_titleLabel\" class=\"short\">For details and examples visit the <a href=\"http:\/\/www.zeiss.com\/microscopy\/en_us\/products\/scanning-electron-microscopes\/sigma.html\">Zeiss<\/a> webpage.<\/span><\/p>\n<p><strong>Location :<\/strong> Fascitelli Center for Advanced Engineering, Suite 060, 2 East Alumni Avenue,&nbsp; Kingston, RI 02881.<\/p>\n<p><strong>Instrument Manager :<\/strong> Matthew Cabral [Email: <a href=\"mailto:matthew.cabral@uri.edu\">matthew.cabral@uri.edu<\/a>].&nbsp;Contact <a href=\"mailto:engimg@etal.uri.edu\">engimg@etal.uri.edu<\/a> for instrument reservation.<\/p>\n<hr>\n<p>The <a href=\"https:\/\/web.uri.edu\/wp-content\/uploads\/sites\/1758\/RIN2-SEM-policy.pdf\">RIN2-SEM policy<\/a> should be <strong>reviewed completely before requesting an appointment<\/strong>. Contact <a href=\"mailto:engimg@etal.uri.edu\">engimg@etal.uri.edu<\/a> for instrument reservation.<\/p>\n\n<!-- iframe plugin v.6.0 wordpress.org\/plugins\/iframe\/ -->\n<iframe loading=\"lazy\" src=\"https:\/\/calendar.google.com\/calendar\/embed?src=uri.edu_vsuus3dk42lguo8k4hn6nfen8s%40group.calendar.google.com&#038;ctz=America%2FNew_York\" style=\"border: 0\" width=\"800\" height=\"600\" frameborder=\"0\" scrolling=\"no\" class=\"iframe-class\"><\/iframe>\n\n<p>&nbsp;<\/p>\n\n\n<figure class=\"wp-block-image size-large\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"768\" src=\"https:\/\/web.uri.edu\/nano\/wp-content\/uploads\/sites\/1758\/IMG_3659-1024x768.jpeg\" alt=\"\" class=\"wp-image-1489\" srcset=\"https:\/\/web.uri.edu\/nano\/wp-content\/uploads\/sites\/1758\/IMG_3659-1024x768.jpeg 1024w, https:\/\/web.uri.edu\/nano\/wp-content\/uploads\/sites\/1758\/IMG_3659-300x225.jpeg 300w, https:\/\/web.uri.edu\/nano\/wp-content\/uploads\/sites\/1758\/IMG_3659-768x576.jpeg 768w, https:\/\/web.uri.edu\/nano\/wp-content\/uploads\/sites\/1758\/IMG_3659-1536x1152.jpeg 1536w, https:\/\/web.uri.edu\/nano\/wp-content\/uploads\/sites\/1758\/IMG_3659-2048x1536.jpeg 2048w, https:\/\/web.uri.edu\/nano\/wp-content\/uploads\/sites\/1758\/IMG_3659-364x273.jpeg 364w, https:\/\/web.uri.edu\/nano\/wp-content\/uploads\/sites\/1758\/IMG_3659-500x375.jpeg 500w, https:\/\/web.uri.edu\/nano\/wp-content\/uploads\/sites\/1758\/IMG_3659-1000x750.jpeg 1000w, https:\/\/web.uri.edu\/nano\/wp-content\/uploads\/sites\/1758\/IMG_3659-1280x960.jpeg 1280w, https:\/\/web.uri.edu\/nano\/wp-content\/uploads\/sites\/1758\/IMG_3659-2000x1500.jpeg 2000w, https:\/\/web.uri.edu\/nano\/wp-content\/uploads\/sites\/1758\/IMG_3659-scaled.jpeg 2560w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n\n\n\n<p><\/p>\n\n\n\n<p>The <strong>use of the facility must be acknowledged<\/strong> in any publications by including the following text in the Acknowledgements section: &#8220;<em>The SEM data was acquired at the RI Consortium for Nanoscience and Nanotechnology, a URI College of Engineering core facility partially funded by the National Science Foundation EPSCoR, Cooperative Agreement #OIA-1655221.&#8221;<\/em><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Instrument : Zeiss Sigma VP field emission scanning electron microscope (FE-SEM) with Oxford Instruments X-max 50 mm2 energy dispersive X-ray spectroscopy (EDS\/EDX) and Gatan Aalto 2500 cryogenic attachment. InLens detector, secondary electron detector, backscattered electron detector, cathodoluminescence and variable pressure mode for non-conductive materials. Detector design allows analysis of magnetic materials at high resolutions. Maximum [&hellip;]<\/p>\n","protected":false},"author":823,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":"","_links_to":"","_links_to_target":""},"class_list":["post-332","page","type-page","status-publish","hentry"],"acf":[],"_links":{"self":[{"href":"https:\/\/web.uri.edu\/nano\/wp-json\/wp\/v2\/pages\/332","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/web.uri.edu\/nano\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/web.uri.edu\/nano\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/web.uri.edu\/nano\/wp-json\/wp\/v2\/users\/823"}],"replies":[{"embeddable":true,"href":"https:\/\/web.uri.edu\/nano\/wp-json\/wp\/v2\/comments?post=332"}],"version-history":[{"count":4,"href":"https:\/\/web.uri.edu\/nano\/wp-json\/wp\/v2\/pages\/332\/revisions"}],"predecessor-version":[{"id":1506,"href":"https:\/\/web.uri.edu\/nano\/wp-json\/wp\/v2\/pages\/332\/revisions\/1506"}],"wp:attachment":[{"href":"https:\/\/web.uri.edu\/nano\/wp-json\/wp\/v2\/media?parent=332"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}