{"id":37900,"date":"2026-03-29T21:08:55","date_gmt":"2026-03-30T01:08:55","guid":{"rendered":"https:\/\/web.uri.edu\/riinbre\/?p=37900"},"modified":"2026-04-01T10:24:19","modified_gmt":"2026-04-01T14:24:19","slug":"wdt-2026-high-resolution-electron-and-x-ray-microscopy","status":"publish","type":"post","link":"https:\/\/web.uri.edu\/riinbre\/wdt-2026-high-resolution-electron-and-x-ray-microscopy\/","title":{"rendered":"WDT 2026 &#8211; High Resolution Electron and X-ray Microscopy"},"content":{"rendered":"\n<h2 class=\"wp-block-heading\">Instructor: Matthew Cabral, PhD, URI<\/h2>\n\n\n\n<p><em><strong>Location: URI<\/strong><\/em><\/p>\n\n\n\n<p>Session 1: June 3 &#8211; 5 (Fascitelli Center for Advanced Engineering)<\/p>\n\n\n\n<p>Session 2: June 29 &#8211; July 1 (Fascitelli Center for Advanced Engineering)<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Course Overview<\/h3>\n\n\n\n<p>This WDT module will provide participants with hands-on training in electron microscopy with an emphasis on scanning electron microscopy (SEM) for imaging and characterizing biological and materials samples.&nbsp;&nbsp;This course will introduce fundamental principles of electron-matter interactions, SEM instrumentation, and imaging workflows used in research and industry.&nbsp;&nbsp;Participants will learn methods to prepare samples for SEM, operate the instrument to acquire high-quality images, and how to utilize various imaging modes, including secondary electron, backscattered electron, and x-ray microanalysis for elemental quantification.&nbsp;&nbsp;This workshop will emphasize practical skills such as optimizing imaging conditions, recognizing artifacts, and troubleshooting common issues encountered during routine electron microscopy.&nbsp;&nbsp;<\/p>\n\n\n\n<p>In addition to the SEM component, this course will also provide introductory demonstration of complementary characterization techniques including x-ray microscopy (XRM) and transmission electron microscopy (TEM).&nbsp;&nbsp;These sessions will highlight how different microscopy techniques can be utilized to study samples across multiple length from the micrometer scale down to the nanoscale.&nbsp;&nbsp;<\/p>\n\n\n\n<p>This module will be completed over 2.5 days and will combine lectures providing theoretical information with laboratory sessions using advanced characterization equipment at URI.&nbsp;&nbsp;Participants in this workshop will gain practical experience in high resolution microscopy with similar experiences to workflows used in research laboratories and industry.&nbsp;&nbsp;&nbsp;Participants who complete this module will receive a RI-INBRE certificate of completion.&nbsp;<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Learning Outcomes<\/h3>\n\n\n\n<p>Upon completion of this module, participants will be able to:&nbsp;<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Explain fundamental principles of electron-matter interactions that enable imaging and analysis in a scanning electron microscope<\/li>\n\n\n\n<li>Identify major components of a SEM and describe the function of detectors including secondary electron, backscattered electron, in-lens, and x-ray detectors<\/li>\n\n\n\n<li>Understand common preparation methods and prepare basic samples for SEM imaging&nbsp;<\/li>\n\n\n\n<li>Operate a SEM to obtain high-quality images by selecting appropriate setting including voltage, working distance, detector, and imaging settings<\/li>\n\n\n\n<li>Recognize and troubleshoot common imaging artifacts such as charging, contamination, drift, and beam damage<\/li>\n\n\n\n<li>Understand basic principles and applications of energy dispersive x-ray spectroscopy (EDS) for elemental analysis<\/li>\n\n\n\n<li>Describe how x-ray microscopy (XRM) and transmission electron microscopy (TEM) complement SEM for multiscale structural characterization<\/li>\n\n\n\n<li>Document microscopy workflows and imaging parameters in a laboratory notebook to support reproducible analysis<\/li>\n<\/ul>\n\n\n\n<h3 class=\"wp-block-heading\">Lab Report<\/h3>\n\n\n\n<p>Students will be expected to maintain detailed laboratory notes to include:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>The sample type and preparation method (mounting, coating, or other preparation steps)<\/li>\n\n\n\n<li>Instrument parameters including accelerating voltage, working distance, probe current, detector, and magnification<\/li>\n\n\n\n<li>Observations related to image quality, contrast, and sample features&nbsp;&nbsp;<\/li>\n\n\n\n<li>Any artifacts or imaging issues encountered, and adjustments made to resolve them<\/li>\n\n\n\n<li>Representative images acquired during the session and brief descriptions of the observed structures<\/li>\n<\/ul>\n\n\n\n<p>Maintaining a detailed laboratory notebook will help participants develop good scientific documentation practices and provide a reference for applying microscopy techniques in their future research or technical settings.&nbsp;&nbsp;<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Resources Used in this Module<\/h3>\n\n\n\n<p>Various lab supplies and equipment<\/p>\n\n\n\n<p>Lecture slides<\/p>\n\n\n\n<p>Lab handouts and SOPs<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Proposed Timeline (subject to change)<\/h3>\n\n\n\n<figure class=\"wp-block-table\"><table class=\"has-fixed-layout\"><tbody><tr><td><\/td><td>Day 1<\/td><td>Day 2<\/td><td>Day 3<\/td><\/tr><tr><td>9:00 AM &#8211; 10: 00 AM                               <\/td><td>Introduction, workshop overrview and safety orientation<\/td><td>Lecture:  Sample preparation techniques for SEM<\/td><td>Lecture: Introduction to TEM and X-ray Microscopy<\/td><\/tr><tr><td>10:00 AM &#8211; 11:-00 AM.                 <\/td><td>Lecture: Fundamentals  of SEM and electron-matter interactions<\/td><td>Demonstration: Sample mounting and preparation<\/td><td>TEM demonstration and discussion<\/td><\/tr><tr><td>11:00 AM &#8211; 12:00 PM<\/td><td>Lecture: SEM Instrumentation and Detectors<\/td><td>Hands-on SEM imaging and optimization of imaging parameters<\/td><td>X-ray Microscope Introduction and discussion<\/td><\/tr><tr><td>12:00 PM &#8211; 1:00 PM<\/td><td>Lunch<\/td><td>Lunch<\/td><td>WDT Survey and Certificate Distrubution<\/td><\/tr><tr><td>1:00 PM &#8211; 2:00 PM<\/td><td>Demonstration: SEM system components and vacuum operation<\/td><td>Lecture: Elemental analysis using EDS<\/td><td><\/td><\/tr><tr><td>2:00 PM &#8211; 3:00 PM<\/td><td>Demonstration: SEM alignment, and setting up imaging conditions<\/td><td>Hands-on SEM session: imaging and elemental analysis<\/td><td><\/td><\/tr><tr><td>3:00 PM &#8211; 4:00 PM<\/td><td>Hands-on SEM training: basic instrument operation and imaging acquisition<\/td><td>Hands-on SEM session: imaging and elemental analysis<\/td><td><\/td><\/tr><\/tbody><\/table><\/figure>\n","protected":false},"excerpt":{"rendered":"<p>Instructor: Matthew Cabral, PhD, URI Location: URI Session 1: June 3 &#8211; 5 (Fascitelli Center for Advanced Engineering) Session 2: June 29 &#8211; July 1 (Fascitelli Center for Advanced Engineering) Course Overview This WDT module will provide participants with hands-on training in electron microscopy with an emphasis on scanning electron microscopy (SEM) for imaging and [&hellip;]<\/p>\n","protected":false},"author":5477,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":"","_links_to":"","_links_to_target":""},"categories":[1],"tags":[],"class_list":["post-37900","post","type-post","status-publish","format-standard","hentry","category-uncategorized"],"acf":[],"_links":{"self":[{"href":"https:\/\/web.uri.edu\/riinbre\/wp-json\/wp\/v2\/posts\/37900","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/web.uri.edu\/riinbre\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/web.uri.edu\/riinbre\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/web.uri.edu\/riinbre\/wp-json\/wp\/v2\/users\/5477"}],"replies":[{"embeddable":true,"href":"https:\/\/web.uri.edu\/riinbre\/wp-json\/wp\/v2\/comments?post=37900"}],"version-history":[{"count":5,"href":"https:\/\/web.uri.edu\/riinbre\/wp-json\/wp\/v2\/posts\/37900\/revisions"}],"predecessor-version":[{"id":37932,"href":"https:\/\/web.uri.edu\/riinbre\/wp-json\/wp\/v2\/posts\/37900\/revisions\/37932"}],"wp:attachment":[{"href":"https:\/\/web.uri.edu\/riinbre\/wp-json\/wp\/v2\/media?parent=37900"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/web.uri.edu\/riinbre\/wp-json\/wp\/v2\/categories?post=37900"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/web.uri.edu\/riinbre\/wp-json\/wp\/v2\/tags?post=37900"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}