Instructor: Matthew Cabral, PhD, URI

Location: URI

Session 1: June 3 – 5 (Fascitelli Center for Advanced Engineering)

Session 2: June 29 – July 1 (Fascitelli Center for Advanced Engineering)

Course Overview

This WDT module will provide participants with hands-on training in electron microscopy with an emphasis on scanning electron microscopy (SEM) for imaging and characterizing biological and materials samples.  This course will introduce fundamental principles of electron-matter interactions, SEM instrumentation, and imaging workflows used in research and industry.  Participants will learn methods to prepare samples for SEM, operate the instrument to acquire high-quality images, and how to utilize various imaging modes, including secondary electron, backscattered electron, and x-ray microanalysis for elemental quantification.  This workshop will emphasize practical skills such as optimizing imaging conditions, recognizing artifacts, and troubleshooting common issues encountered during routine electron microscopy.  

In addition to the SEM component, this course will also provide introductory demonstration of complementary characterization techniques including x-ray microscopy (XRM) and transmission electron microscopy (TEM).  These sessions will highlight how different microscopy techniques can be utilized to study samples across multiple length from the micrometer scale down to the nanoscale.  

This module will be completed over 2.5 days and will combine lectures providing theoretical information with laboratory sessions using advanced characterization equipment at URI.  Participants in this workshop will gain practical experience in high resolution microscopy with similar experiences to workflows used in research laboratories and industry.   Participants who complete this module will receive a RI-INBRE certificate of completion. 

Learning Outcomes

Upon completion of this module, participants will be able to: 

• Explain fundamental principles of electron-matter interactions that enable imaging and analysis in a scanning electron microscope
• Identify major components of a SEM and describe the function of detectors including secondary electron, backscattered electron, in-lens, and x-ray detectors
• Understand common preparation methods and prepare basic samples for SEM imaging 
• Operate a SEM to obtain high-quality images by selecting appropriate setting including voltage, working distance, detector, and imaging settings
• Recognize and troubleshoot common imaging artifacts such as charging, contamination, drift, and beam damage
• Understand basic principles and applications of energy dispersive x-ray spectroscopy (EDS) for elemental analysis
• Describe how x-ray microscopy (XRM) and transmission electron microscopy (TEM) complement SEM for multiscale structural characterization
• Document microscopy workflows and imaging parameters in a laboratory notebook to support reproducible analysis

Lab Report

Students will be expected to maintain detailed laboratory notes to include:

• The sample type and preparation method (mounting, coating, or other preparation steps)
• Instrument parameters including accelerating voltage, working distance, probe current, detector, and magnification
• Observations related to image quality, contrast, and sample features  
• Any artifacts or imaging issues encountered, and adjustments made to resolve them
• Representative images acquired during the session and brief descriptions of the observed structures

Maintaining a detailed laboratory notebook will help participants develop good scientific documentation practices and provide a reference for applying microscopy techniques in their future research or technical settings.  

Resources Used in this Module

Various lab supplies and equipment

Lecture slides

Lab handouts and SOPs

Proposed Timeline (subject to change)

	Day 1	Day 2	Day 3
9:00 AM – 10: 00 AM	Introduction, workshop overrview and safety orientation	Lecture: Sample preparation techniques for SEM	Lecture: Introduction to TEM and X-ray Microscopy
10:00 AM – 11:-00 AM.	Lecture: Fundamentals of SEM and electron-matter interactions	Demonstration: Sample mounting and preparation	TEM demonstration and discussion
11:00 AM – 12:00 PM	Lecture: SEM Instrumentation and Detectors	Hands-on SEM imaging and optimization of imaging parameters	X-ray Microscope Introduction and discussion
12:00 PM – 1:00 PM	Lunch	Lunch	WDT Survey and Certificate Distrubution
1:00 PM – 2:00 PM	Demonstration: SEM system components and vacuum operation	Lecture: Elemental analysis using EDS
2:00 PM – 3:00 PM	Demonstration: SEM alignment, and setting up imaging conditions	Hands-on SEM session: imaging and elemental analysis
3:00 PM – 4:00 PM	Hands-on SEM training: basic instrument operation and imaging acquisition	Hands-on SEM session: imaging and elemental analysis