Instrument : Zeiss Sigma VP field emission scanning electron microscope (FE-SEM) with Oxford Instruments X-max 50 mm2 energy dispersive X-ray spectroscopy (EDS/EDX) and Gatan Aalto 2500 cryogenic attachment. InLens detector, secondary electron detector, backscattered electron detector, cathodoluminescence and variable pressure mode for non-conductive materials. Detector design allows analysis of magnetic materials at high resolutions. Maximum resolution 2 nm. For details and examples visit the Zeiss webpage.

Location : Fascitelli Center for Advanced Engineering, Suite 060, 2 East Alumni Avenue,  Kingston, RI 02881.

Instrument Manager : Matthew Cabral [Email: matthew.cabral@uri.edu]. Contact engimg@etal.uri.edu for instrument reservation.

The RIN2-SEM policy should be reviewed completely before requesting an appointment. Contact engimg@etal.uri.edu for instrument reservation.


The use of the facility must be acknowledged in any publications by including the following text in the Acknowledgements section: “The SEM data was acquired at the RI Consortium for Nanoscience and Nanotechnology, a URI College of Engineering core facility partially funded by the National Science Foundation EPSCoR, Cooperative Agreement #OIA-1655221.”